Substrate Crosstalk Analysis in Mixed Signal CMOS Integrated Circuits
نویسندگان
چکیده
| Substrate crosstalk modeling and analysis techniques for a reliable SoC oriented mixed signal IC design are outlined. Substrate noise measurements by use of a source follower and a latched comparator clearly indicate that L di=dt and R i e ects on Vdd/Gnd wirings appear in the substrate. An experimental full chip substrate crosstalk veri cation system based on a macroscopic substrate noise model efciently analyzes the analog performance degradation relevant to the digital activity on the same chip.
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